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March 01, 2016 conference-paper Open access

Negative Effects of Bytecode Instrumentation on Java Source Code Coverage

IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER)

DOI: 10.1109/saner.2016.61 Full text (OA) OpenAlex

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Cited by 1 stored of 16

Fine-grained Code Coverage Measurement in Automated Black-box Android Testing
2020 ACM Transactions on Software Engineering and Methodology article Computer Science Software Testing and Debugging Techniques Open access cited by 1 patent

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