May 12, 2016 article Open access Tutorial: Defects in semiconductors—Combining experiment and theory Journal of Applied Physics DOI: 10.1063/1.4948245 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 443 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Microscopic origins of electron trapping in amorphous silicon nitride ( a -Si 3 N 4 ) and its role in charge-trap flash memory 2026 Journal of Physics Condensed Matter article Engineering Semiconductor materials and devices Open access 0 citations Impact of Trap Depth on the Steady‐State and Transient Photoluminescence in Halide Perovskite Films 2025 Advanced Energy Materials article Engineering Perovskite Materials and Applications Open access 15 citations Engineering shallow and deep level defects in κ-Ga2O3 thin films: comparing metal-organic vapour phase epitaxy to molecular beam epitaxy and the effect of annealing treatments 2024 Materials Today Physics article Materials Science Ga2O3 and related materials Open access 25 citations 3 results References 0