August 09, 2012 review Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale Chemical Reviews DOI: 10.1021/cr3001109 OpenAlex Authors 0 Author list not loaded yet. Cited by 4 stored of 1,425 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access 3D electron diffraction—the missing slice completing nanoscale analysis of organic solar cells in TEM 2026 Nature Communications article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 2 citations A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction 2025 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access 5 citations Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors 2024 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access 7 citations Influence of the Deposition Rate on the Alignment and Performance of Perylene-3,4,9,10-tetracarboxylic Tetraethyl Ester in an Organic Light Emitting Diode 2024 ACS Applied Electronic Materials article Engineering Organic Light-Emitting Diodes Research Open access 4 citations 4 results References 0