August 14, 2015 article Degradation Modeling Based on a Time-Dependent Ornstein-Uhlenbeck Process and Residual Useful Lifetime Estimation IEEE Transactions on Reliability DOI: 10.1109/tr.2015.2462353 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 52 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Quantifying uncertainty with a derivative tracking SDE model and application to wind power forecast data 2021 Statistics and Computing article Engineering Energy Load and Power Forecasting Open access 0 citations 1 result References 0