January 01, 2009 conference-paper WISE: Automated test generation for worst-case complexity DOI: 10.1109/icse.2009.5070545 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 132 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Ernst Denert Award for Software Engineering 2022 2024 Springer eBooks book Computer Science Software Engineering Techniques and Practices Open access 0 citations Inferring Lower Runtime Bounds for Integer Programs 2020 ACM Transactions on Programming Languages and Systems article Computer Science Logic, programming, and type systems Open access 12 citations Ernst Denert Award for Software Engineering 2019 2020 Springer eBooks book Computer Science Software Engineering Techniques and Practices Open access 2 citations 3 results References 0