May 01, 1995 article An integrated framework for yield management and defect/fault reduction IEEE Transactions on Semiconductor Manufacturing DOI: 10.1109/66.382274 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 35 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Reinforcement Learning Agent for Multi-Objective Online Process Parameter Optimization of Manufacturing Processes 2025 Applied Sciences article Computer Science Advanced Multi-Objective Optimization Algorithms Open access cited by 1 patent 3 citations 1 result References 0