January 14, 2015 article Open access Dark-field X-ray microscopy for multiscale structural characterization Nature Communications DOI: 10.1038/ncomms7098 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 289 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Comparison of Kikuchi diffraction geometries in the scanning electron microscope 2025 Materials Characterization article Engineering Advanced Materials Characterization Techniques Open access 12 citations Time resolved insights into abnormal grain growth by in situ synchrotron measurements 2023 Acta Materialia article Materials Science Microstructure and mechanical properties Open access 9 citations Employing Surface Curvature for Spatially Resolved X‐Ray Reflectivity: Graphene Domains on Liquid Copper 2023 Advanced Materials Interfaces article Materials Science Electron and X-Ray Spectroscopy Techniques Open access 8 citations 3 results References 0