June 01, 1998 article A new model for step-stress testing IEEE Transactions on Reliability DOI: 10.1109/24.722275 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 159 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Heterogeneous Step-Stress Model for Type-I Censored Exponential Lifetime Under Continuous and Interval Monitoring 2026 IEEE Transactions on Reliability article Mathematics Statistical Distribution Estimation and Applications 0 citations Maximum Product of Spacings Estimator Under Type-I Censoring With an Application to a Step-Stress Model With Weibull Lifetimes 2024 IEEE Transactions on Reliability article Mathematics Statistical Distribution Estimation and Applications 5 citations Product of Spacings Estimation in Step-Stress Accelerated Life Testing: An Alternative to Maximum Likelihood 2024 IEEE Transactions on Reliability article Mathematics Statistical Distribution Estimation and Applications 14 citations 3 results References 0