November 11, 2004 article Open access High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data Journal of Applied Crystallography DOI: 10.1107/s0021889804023349 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 85 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Synchrotron EDXRD strain-temperature measurement during laser welding 2024 Proceedings of the Institution of Mechanical Engineers Part L Journal of Materials Design and Applications article Engineering Welding Techniques and Residual Stresses 2 citations 1 result References 0