October 04, 2011 article The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps IEEE Transactions on Electron Devices DOI: 10.1109/ted.2011.2164543 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 486 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Variability and high temperature reliability of graphene field-effect transistors with thin epitaxial CaF2 insulators 2024 npj 2D Materials and Applications article Materials Science Graphene research and applications Open access 13 citations Variability and High Temperature Reliability of Graphene Field-Effect Transistors with Thin Epitaxial CaF2 Insulators 2024 Research Square preprint Materials Science Graphene research and applications Open access 0 citations Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuning 2022 Nature Electronics article Materials Science Graphene research and applications Open access 140 citations 3 results References 0