March 01, 2003 article RTS amplitudes in decananometer MOSFETs: 3-D simulation study IEEE Transactions on Electron Devices DOI: 10.1109/ted.2003.811418 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 263 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Variability and high temperature reliability of graphene field-effect transistors with thin epitaxial CaF2 insulators 2024 npj 2D Materials and Applications article Materials Science Graphene research and applications Open access 13 citations Variability and High Temperature Reliability of Graphene Field-Effect Transistors with Thin Epitaxial CaF2 Insulators 2024 Research Square preprint Materials Science Graphene research and applications Open access 0 citations 2 results References 0