November 22, 2011 article A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM Ultramicroscopy DOI: 10.1016/j.ultramic.2011.11.005 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 48 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide 2023 Physical review. B./Physical review. B article Materials Science Graphene research and applications Open access 1 citations Complementary LEEM and eV-TEM for imaging and spectroscopy 2021 Ultramicroscopy article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 11 citations 2 results References 0