November 12, 2012 article Open access Revisiting MOSFET threshold voltage extraction methods Microelectronics Reliability DOI: 10.1016/j.microrel.2012.09.015 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 351 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Application of gate-to-channel capacitance measurements for extraction and investigation of the effective mobility in MoS 2 field effect transistors with hysteresis of electrical characteristics 2026 Physica Scripta article Materials Science 2D Materials and Applications Open access 0 citations Emerging reconfigurable electronic devices based on two‐dimensional materials: A review 2022 InfoMat article Materials Science 2D Materials and Applications Open access 108 citations 2 results References 0