January 01, 2001 article A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy Applied Physics Letters DOI: 10.1063/1.1335546 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 323 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Local stiffness and work function variations of hexagonal boron nitride on Cu(111) 2021 Beilstein Journal of Nanotechnology article Physics and Astronomy Force Microscopy Techniques and Applications Open access 4 citations Local stiffness and work-function variations of hexagonal boron nitride on Cu(111) 2021 preprint Physics and Astronomy Force Microscopy Techniques and Applications Open access 2 citations 2 results References 0