July 01, 2004 article Second Generation of Correction Methods in Electron Probe X-ray Microanalysis: Approximation Models for Emission Depth Distribution Functions Journal of Analytical Chemistry DOI: 10.1023/b:janc.0000035269.96076.d2 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 34 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Inverse Modeling of Heterogeneous Structures in Electron Probe Microanalysis 2024 Microscopy and Microanalysis article Materials Science Electron and X-Ray Spectroscopy Techniques Open access 1 citations 1 result References 0