July 24, 2012 article Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution IEEE Transactions on Reliability DOI: 10.1109/tr.2012.2208301 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 56 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Statistical inference and optimal design for step-stress accelerated life testing with hybrid group censoring for non-destructive one-shot devices 2025 Reliability Engineering & System Safety article Engineering Reliability and Maintenance Optimization Open access 7 citations 1 result References 0