March 03, 1980 article Negative-U Properties for Point Defects in Silicon Physical Review Letters DOI: 10.1103/physrevlett.44.593 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 336 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Anderson’s negative- U chemistry in amorphous silicon nitride: A complex system approach 2025 Science Advances article Engineering Semiconductor materials and devices Open access 6 citations Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl 2021 Applied Magnetic Resonance article Biochemistry, Genetics and Molecular Biology Electron Spin Resonance Studies 0 citations 2 results References 0