May 01, 1983 article A distance measure between attributed relational graphs for pattern recognition IEEE Transactions on Systems Man and Cybernetics DOI: 10.1109/tsmc.1983.6313167 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 1,021 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access From Legacy to Standard: LLM-Assisted Transformation of Cybersecurity Playbooks into CACAO Format 2026 Lecture notes in computer science conference-paper Computer Science Information and Cyber Security 3 citations An Alignment Method and a Dissimilarity Measure for 3D Building Spatial Designs 2025 IEEE Access article Engineering Architecture and Computational Design Open access 1 citations Event Abstraction for Partial Order Patterns 2023 Lecture notes in computer science conference-paper Business, Management and Accounting Business Process Modeling and Analysis 3 citations 3 results References 0