May 05, 2003 article Constant‐Distance Mode Scanning Electrochemical Microscopy (SECM)—Part I: Adaptation of a Non‐Optical Shear‐Force‐Based Positioning Mode for SECM Tips Chemistry - A European Journal DOI: 10.1002/chem.200204267 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 161 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Measuring local pH in electrochemistry 2020 Current Opinion in Electrochemistry review Chemistry Electrochemical Analysis and Applications Open access cited by 5 patents 157 citations 1 result References 0