November 01, 1949 article A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer Journal of Applied Physics DOI: 10.1063/1.1698268 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 831 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction 2025 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access 5 citations A Brief Overview of Texture and Anisotropy 2021 IOP Conference Series Materials Science and Engineering conference-paper Materials Science Microstructure and mechanical properties Open access 3 citations 2 results References 0