January 01, 2012 article Open access Inline Process Metrology System for the Control of Laser Surface Structuring Processes Physics Procedia DOI: 10.1016/j.phpro.2012.10.105 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 24 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access OCT sensor technology enables guaranteed quality and first-time-right in 3D printing with powder and wire 2024 Industrial Optical Devices and Systems (ODS) conference-paper Engineering Optical Coherence Tomography Applications 0 citations Dynamic, Adaptive Inline Process Monitoring for Laser Material Processing by Means of Low Coherence Interferometry 2021 Applied Sciences article Computer Science Optical measurement and interference techniques Open access 4 citations Processing of Keyhole Depth Measurement Data during Laser Beam Micro Welding 2020 Proceedings of the Institution of Mechanical Engineers Part L Journal of Materials Design and Applications article Engineering Welding Techniques and Residual Stresses cited by 1 patent 7 citations 3 results References 0