November 01, 1993 article A two-ellipsoid overlap test for on-line failure detection Automatica DOI: 10.1016/0005-1098(93)90014-k OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 18 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Parameter Filter-based Event-triggered Learning 2025 European Control Conference (ECC) conference-paper Engineering Control Systems and Identification 0 citations 1 result References 0