February 01, 1986 article Pulsed laser atom probe analysis of semiconductor materials Journal of Microscopy DOI: 10.1111/j.1365-2818.1986.tb02712.x OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 61 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Atom Probe Tomography 2021 Elsevier eBooks book-chapter Engineering Advanced Materials Characterization Techniques Open access 399 citations 1 result References 0