July 24, 2008 article Sub-micron resolution CT for failure analysis and process development Measurement Science and Technology DOI: 10.1088/0957-0233/19/9/094001 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 106 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Integrating expert feedback on the spot in a time-efficient explorative CT scanning workflow for cultural heritage objects 2021 Journal of Cultural Heritage article Arts and Humanities Cultural Heritage Materials Analysis Open access 40 citations 1 result References 0