May 01, 1995 article An Accelerated Life Test Model Based on Reliability Kinetics Technometrics DOI: 10.1080/00401706.1995.10484298 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 97 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Heterogeneous Step-Stress Model for Type-I Censored Exponential Lifetime Under Continuous and Interval Monitoring 2026 IEEE Transactions on Reliability article Mathematics Statistical Distribution Estimation and Applications 0 citations Simple Heterogeneous Step‐Stress Accelerated Life Testing Model Under Type II Censoring 2025 Quality and Reliability Engineering International article Engineering Reliability and Maintenance Optimization Open access 1 citations 2 results References 0