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October 01, 2012 conference-paper

Exception Handling Defects: An Empirical Study

Proceedings - IEEE International Symposium on High-Assurance Systems Engineering/Proceedings

DOI: 10.1109/hase.2012.24 OpenAlex

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Cited by 1 stored of 39

Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing
2020 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) conference-paper Computer Science Software Testing and Debugging Techniques

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