April 15, 2013 article Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress IEEE Transactions on Reliability DOI: 10.1109/tr.2013.2257054 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 74 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Heterogeneous Step-Stress Model for Type-I Censored Exponential Lifetime Under Continuous and Interval Monitoring 2026 IEEE Transactions on Reliability article Mathematics Statistical Distribution Estimation and Applications 0 citations Preliminaries 2023 Elsevier eBooks book-chapter Mathematics Statistical Distribution Estimation and Applications 0 citations 2 results References 0