August 19, 2010 article Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns Ultramicroscopy DOI: 10.1016/j.ultramic.2010.08.001 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 141 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Comparison of Kikuchi diffraction geometries in the scanning electron microscope 2025 Materials Characterization article Engineering Advanced Materials Characterization Techniques Open access 12 citations 1 result References 0