October 23, 2000 article Analytic method based on identification of ellipse parameters for scanner calibration in cone-beam tomography Physics in Medicine and Biology DOI: 10.1088/0031-9155/45/11/327 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 233 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Scale correction in submicron computed tomography with a submillimeter field of view 2025 Tomography of Materials and Structures article Engineering Advanced Measurement and Metrology Techniques Open access 0 citations 1 result References 0