February 01, 1993 article ELD — a computer program system for extracting intensities from electron diffraction patterns Ultramicroscopy DOI: 10.1016/0304-3991(93)90221-i OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 107 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access RAPID : an ImageJ macro for indexing electron diffraction zone axis spot patterns of cubic materials 2024 Journal of Applied Crystallography article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 5 citations 1 result References 0