February 04, 2011 article The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS Journal of Solid State Electrochemistry DOI: 10.1007/s10008-010-1289-0 OpenAlex Authors 0 Author list not loaded yet. Cited by 4 stored of 119 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A Tracer Diffusion Study of Diverse Photo‐Ionic Phenomena in Strontium Titanate 2025 Advanced Functional Materials article Materials Science Advancements in Solid Oxide Fuel Cells Open access 2 citations Quantitative Determination of Native Point‐Defect Concentrations at the ppm Level in Un‐Doped BaSnO3 Thin Films 2022 Advanced Functional Materials article Materials Science Electronic and Structural Properties of Oxides Open access 14 citations Faster Diffusion of Oxygen Along Dislocations in (La,Sr)MnO 3+δ Is a Space‐Charge Phenomenon 2021 Advanced Functional Materials article Materials Science Advancements in Solid Oxide Fuel Cells Open access 30 citations Oxygen Surface Exchange and Tracer Diffusion in Differently Oriented Thin Films of Gd-Doped CeO2 2020 ACS Applied Materials & Interfaces article Materials Science Advancements in Solid Oxide Fuel Cells 13 citations 4 results References 0