March 01, 1997 article Thin film and surface characterization by specular X-ray reflectivity Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences DOI: 10.1080/10408439708241258 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 261 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Instrumentation and uncertainty evaluation for absolute characterization of thin films and nanostructured surfaces in advanced optical metrology 2025 Metrologia article Decision Sciences Scientific Measurement and Uncertainty Evaluation Open access 6 citations An in-depth investigation of the native oxide formed on Al-Zn-Mg-Cu alloys by XPS, XRR and ToF-SIMS 2024 Applied Surface Science article Engineering Aluminum Alloy Microstructure Properties 43 citations Employing Surface Curvature for Spatially Resolved X‐Ray Reflectivity: Graphene Domains on Liquid Copper 2023 Advanced Materials Interfaces article Materials Science Electron and X-Ray Spectroscopy Techniques Open access 8 citations 3 results References 0