January 01, 2015 article Open access Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates The Analyst DOI: 10.1039/c5an00860c Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 31 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Bioscience 2025 Royal Society of Chemistry eBooks book-chapter Engineering Ion-surface interactions and analysis 0 citations 1 result References 0