October 15, 2015 article Open access Dynamic intensity normalization using eigen flat fields in X-ray imaging Optics Express DOI: 10.1364/oe.23.027975 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 126 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Multi-stage deep learning artifact reduction for parallel-beam computed tomography 2025 Journal of Synchrotron Radiation article Engineering Advanced X-ray and CT Imaging Open access 4 citations Revealing the influence of ring-shaped beam profiles in high-speed laser beam microwelding by synchrotron x-ray imaging 2024 Journal of Laser Applications article Engineering Welding Techniques and Residual Stresses 6 citations 2 results References 0