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April 01, 2015 conference-paper

BEN: A combinatorial testing-based fault localization tool

IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

DOI: 10.1109/icstw.2015.7107446 OpenAlex

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Cited by 1 stored of 34

A Comparison Infrastructure for Fault Characterization Algorithms
2020 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) conference-paper Computer Science Software Testing and Debugging Techniques

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