April 19, 2005 conference-paper Impact of few electron phenomena on floating-gate memory reliability DOI: 10.1109/iedm.2004.1419320 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 45 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Memristively programmable transistors 2021 Nanotechnology article Engineering Advanced Memory and Neural Computing Open access 3 citations 1 result References 0