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January 05, 2006 conference-paper

One-against-all multi-class SVM classification using reliability measures

IEEE International Joint Conference on Neural Networks (IJCNN)

DOI: 10.1109/ijcnn.2005.1555963 OpenAlex

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Cited by 1 stored of 198

Data mining methods for macro level process planning
2020 Procedia CIRP article Engineering Manufacturing Process and Optimization Open access

10

citations

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