July 08, 2015 article Open access Smart Align—a new tool for robust non-rigid registration of scanning microscope data Advanced Structural and Chemical Imaging DOI: 10.1186/s40679-015-0008-4 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 398 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access The Physics of Twin Boundary Termination in Cu(In, Ga)Se2 Absorbers 2023 Solar RRL article Engineering Chalcogenide Semiconductor Thin Films Open access 4 citations Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series 2020 Microscopy and Microanalysis article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications 4 citations Optimizing Non-Rigid Registration for Scanning Transmission Electron Microscopy Image Series 2020 preprint Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 0 citations 3 results References 0