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Electrostatic transfer of submicrometer magnetic particles onto cantilevers using a focused ion-beam system2026 Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena article Physics and Astronomy Force Microscopy Techniques and Applications Open access
Peter Sun, George R. Du Laney, Tim M. Fuchs, Tjerk H. Oosterkamp, Malcolm G. Thomas, John A. Marohn
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