Device
Abstract
An alternating current compensation circuit (36) for a Scanning Probe Microscope (SPM) device (30) such as a Scanning Tunnelling Microscope (STM) is provided. The alternating current compensation circuit (36) includes, or is coupleable to, a voltage or current source (34). This generates a compensation current to cancel or minimise a capacitive current formed by a junction capacitance during an operation of the SPM device (30) at high frequencies, also known as a parasitic capacitance or tunnelling capacitance between two surfaces (e.g. probe, tip or sample). This may use an inverter (52) such as a balun (54) with either a high-electron mobility transistor (HEMT) (68), summing circuit (70), lock-in amplifier (74) or tuneable stub (82).
Inventors 3
- Milan, Allan
- Marcel, J Rost
- Kier, Heeck
Inventors are linked to an Aachen author when surname and first name match exactly one author.
Applicants
- Universiteit Leiden GBS Leiden
Cited papers 0 in the database
Non-patent literature as cited (2)
- - REVIEW OF SCIENTIFIC INSTRUMENTS, vol 75, 2002, LEE DAVID T ET AL, "Instrumentation for direct, low frequency scanning capacitance microscopy, and analysis of position dependent stray capacitance", pages 3525-3533
- - REVIEW OF SCIENTIFIC INSTRUMENTS, vol 60, 1989, PELZ J P ET AL, "Extremely low-noise potentiometry with a scanning tunneling microscope", pages 301-305